Instrument Systems presents new UV measurement technology at SIL USA 2017

Feb. 21, 2017
At this year's Strategies in Light USA (SIL USA), which will take place from February 28 - March 2, 2017 in Anaheim, California, Instrument Systems will showcase its new portfolio of UV measurement instruments at booth 401. Additionally, an expert speech will be given on the challenges of ultraviolet radiation sources right on the exhibition floor.

The new UV measurement solution presented by the Munich light measurement manufacturer consists of a spectroradiometer from the proven CAS series as well as a series of integrating spheres specifically designed for UV sources. This all-in-one system is suitable for laboratory applications and in production environments. It reliably and precisely measures samples with various radiation spectra in the UV-A, UV-B and UV-C range starting at 200 nm.

Product manager Dr. Tobias Roesener will provide detailed information about the challenges of and potential applications for UV-source measurement. He will lecture on Wednesday, 1st March 2017 at 1 pm in the Exhibitor Presentation Theater.

At the Instrument Systems booth, visitors can also find out more about the LGS 350 goniophotometer for angle-dependent measurement of medium-sized SSL products as well as the measurement space for light-metrological characterization of high-power LEDs. Sales engineers from Instrument Systems will also be present and pleased to advise you on individual measurement solutions.

As a further highlight, Instrument Systems will premiere its newly published "Handbook of LED and SSL Metrology" at the SIL USA, which will be released at the end of February 2017. Interested visitors can obtain a free excerpt of the handbook at the Instrument Systems booth.


Instrument Systems GmbH
+49 (0)89 454943-0