LayTec Pyro 400 measures real GaN surface temperature

Jan. 21, 2010
Date Announced: 21 Jan 2010 LayTec has developed the new generation of pyrometers working at the wavelength of 400 nm: Pyro 400. The tool is the first real solution for measuring exact surface temperature of GaN layers, which is essential for growth optimization and temperature control in LED and laser production. Pyro 400 provides direct access to the GaN temperature distribution across each wafer. Together with the complementary reflectance and curvature data measured by LayTec's EpiCurve®TT system, the in-situ measurements give all important information needed to optimize uniformity and LED performance.

LayTec GmbH Seesener Str. 10-13 10709 Berlin, Germany

E-mail:[email protected]