Instrument Systems launches DTS140 NVIS display-test-system

Aug. 27, 2008
Date Announced: 27 Aug 2008 Fast and accurate NVIS measurement system at lower ownership costInstrument Systems – a leading manufacturer of systems for spectoradiometric light measurement – presents the DTS140 NVIS as the latest generation of the company’s fast, CCD-based spectroradiometers with a proven track record worldwide.These instruments are used for carrying out measurements on night vision compatible displays and panel graphics. The new DTS140 NVIS enables displays to be tested with a turnkey plug-and-play system that takes measurements fast within 30 seconds. This system is a sophisticated lower cost option that meets the SPECTRO 320 industrial standard. NVIS radiance can be measured using the DTS140 NVIS even at 0.5fL. Since polarization errors are only 0.4%, LCD displays can also be precisely tested.The new DTS140 NVIS from Instrument Systems exceeds all the specifications in conformity with MIL-L-85762A / MIL-STD-3009. The measured values have outstanding correlation with traditional scanning spectroradiometers for LED and incandescent backlit panels. The test object can be very easily positioned and focused using the integrated view-finder camera. The Pritchard style optical design ensures perfect match between the view-finder image and the actual measuring spot. Automatic selection of four different measuring spot sizes (apertures) and an automated density filter wheel permit highly flexible and reliable handling.The latest SpecWin Pro software for Windows XP and Vista is used for the DTS140 NVIS. The software enables measured values to be conveniently analyzed and documented in detail. SpecWin Pro delivers basic pass/fail reports and also carries out fully automated test and measurement operations in production environments.

Instrument Systems GmbH Petra Jürgens Tel. +49 (0) 89-45 49 43-23 Fax. +49 (0) 89-45 49 43-11

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