Photon adds 2-D and 3-D visualization to NanoScan Beam Profiler

July 20, 2005
Date Announced: 20 Jul 2005 San Jose, CA - Photon, a leading manufacturer of beam profiling optical test equipment announces the addition of 2-Dimensional and 3-Dimensional beam profile visualization to its NanoScan Beam Profiler. The NanoScan employs the scanning slit beam profiling technique, which generates two orthogonal linear profiles. This data becomes more intuitive when 2-Dimensional and 3-Dimensional images are generated from these profiles. For active optical alignment, this qualitative information has been shown to be especially useful. For these reasons, the standard NanoScan software package now includes this important new visualization tool.The Photon NanoScan is sub-micron resolution profiler used to align optics and characterize lasers in a wide variety of applications. The NanoScan has three detector options: a silicon detector for operation at 350-1000 nm wavelengths, a germanium detector for 700-1800 nm wavelengths, and a pyroelectric detector for 190nm – 20micron wavelengths. The NanoScan accurately measures continuous wave beams as small as 4 microns and as large as 20mm. Powers as low as a few micro Watts, or as high as few kilowatts can be measured with appropriate NanoScan models. Photon is located in San Jose, California in the United States and has supplied beam profiling instrumentation for over 20 years to the laser and photonics communities. Photon has earned several patents and new product awards for innovations over this period.

Mary Russell Tel. 418.226.1000, x120 Fax 408.226.1025

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